Abstract: The era of artificial neural network (ANN) began with a simplified application in many fields and remarkable success in pattern recognition (PR) even in manufacturing industries. Although ...
Abstract: Defect pattern recognition (DPR) of wafer maps is critical for determining the root cause of production defects, which can provide insights for the yield improvement in wafer foundries.
Some results have been hidden because they may be inaccessible to you
Show inaccessible results