A monthly overview of things you need to know as an architect or aspiring architect. Unlock the full InfoQ experience by logging in! Stay updated with your favorite authors and topics, engage with ...

A newly drafted IEEE standard will bring more consistency to defect metrics in analog/mixed (AMS) designs, a long-overdue step that has become too difficult to ignore in the costly heterogeneous ...

Automotive manufacturers are improving quality control by applying precise metrics like Cp, Cpk, and GR&R to track process capability and measurement accuracy. Combined with structured improvement ...

Unlock the full InfoQ experience by logging in! Stay updated with your favorite authors and topics, engage with content, and download exclusive resources. Dany Lepage discusses the architectural ...

(Editor's Note: This is the first of a series of articles that will define what is predicted yield improvement and how it can be measured or validated using test data) Design for Yield (DFY) tools are ...